By Xiao Liu
This booklet first offers a finished assurance of cutting-edge validation suggestions in response to real-time sign tracing to assure the correctness of VLSI circuits. The authors speak about a number of key demanding situations in post-silicon validation and supply automatic recommendations which are systematic and inexpensive. a chain of computerized tracing recommendations and leading edge layout for debug (DfD) ideas are defined, together with concepts for hint sign choice for boosting visibility of sensible mistakes, a multiplexed sign tracing approach for bettering sensible blunders detection, a tracing resolution for debugging electric mistakes, an interconnection cloth for expanding info bandwidth and aiding multi-core debug, an interconnection cloth layout and optimization strategy to bring up move flexibility and a DfD layout and linked tracing resolution for bettering debug potency and increasing tracing window. The options provided during this publication enhance the validation caliber of VLSI circuits, and finally allow the layout and fabrication of trustworthy digital devices.
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Additional resources for Trace-based post-silicon validation for VLSI circuits
To note, the number of detected errors indicated with “All” tends to be higher than the one with the optimal trace signal grouping solution. This is because the DfD structure constraint only a small part from accessible signals to be traced. 7 % of all detectable errors (as shown in Fig. 9b), which demonstrates the effectiveness of our method. We also observe that most evidences captured by accessible signals are within two sequential levels from the root-cause, showing the effectiveness of trace solutions on error localization.
Based on the definitions, the trace signal selection problem becomes: how to set SV to be ‘1’ for a constrained number of signals, so that the CUD’s total assertion visibility (T AV = AV ) for all assertions is maximized. As shown in Fig. 9, our algorithm selects trace signals incrementally, and each time we will select the signals relevant to one assertion. For each iteration, we temporarily select the signals within every un-selected assertion signal group, and then Fig. 3 Trace Signal Selection 25 together with the already selected nodes, we calculate circuit-level visibility to obtain the total assertion visibility increase T AV .
1, 3, 6, 74]). Fig. 1 depicts the general trace-based debug architecture. At design stage, a number of internal signals are selected to be tapped. Then, during debug phase, part of the tapped signals are transferred through interconnection fabric (usually MUX tree) to on-chip trace buffer or off-chip trace port. To save DfD cost, designers can only afford to tap a small number of signals. Therefore, it is essential to select those signals that can provide a better view of the CUD to help designers root-cause bugs [35, 42, 78].